| 摘要 |
<p>Apparatus for irradiating a sample, comprising an interferometer forwarding an electromagnetic radiation and a sample arm receiving the electromagnetic radiation, wherein the sample arm includes an arrangement which is configured to produce at least two radiations from the electromagnetic radiation so as to irradiate the sample, and to delay a first radiation of the at least two radiations with respect to a second radiation of the at least two radiations.</p> |
