发明名称 |
Semiconductor device with a drain region underlying a gate contact pad |
摘要 |
The present invention relates to a semiconductor device and has an object to enhance a di / dt tolerance and a dV / dt tolerance without increasing an ON resistance.
In order to achieve the object described above, an underpad drain region is provided in an upper main surface of a semiconductor substrate (1) under a gate pad (12), a conductive layer (10) connected to said gate pad (12) being buried in an insulating layer (7) so as to be closer to said upper main surface than said gate pad. |
申请公布号 |
EP2383790(A1) |
申请公布日期 |
2011.11.02 |
申请号 |
EP20110174242 |
申请日期 |
2001.04.04 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA |
发明人 |
HATADE, KAZUNARI;HISAMOTO, YOSHIAKI |
分类号 |
H01L29/78;H01L21/336;H01L27/00;H01L29/06;H01L29/08;H01L29/10;H01L29/40;H01L29/423;H01L29/739 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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