发明名称 Method for fabricating capacitor utilizes a sacrificial pattern enclosing the upper outer walls of the storage nodes
摘要 A method for fabricating a capacitor includes forming an isolation layer over a cell region and a peripheral region of a substrate. The isolation layer forms a plurality of open regions in the cell region. Storage nodes are formed on surfaces of the open regions. An upper portion of the isolation layer is etched to expose upper outer walls of the storage nodes. A sacrificial pattern is formed over the isolation layer to enclose the upper outer walls of the storage nodes. The isolation layer in the peripheral region is etched to expose side portions of the resulting structure obtained after forming the sacrificial pattern in the cell region. With the sacrificial pattern supporting the storage nodes, the isolation layer in the cell region is removed. The sacrificial pattern is then removed.
申请公布号 US8048757(B2) 申请公布日期 2011.11.01
申请号 US201113069290 申请日期 2011.03.22
申请人 HYNIX SEMICONDUCTOR INC. 发明人 ROH JAE-SUNG;LEE KEE-JEUNG;SONG HAN-SANG;YEOM SEUNG-JIN;KIL DEOK-SIN;KIM YOUNG-DAE;KIM JIN-HYOCK
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
主权项
地址