发明名称 Processing method for recovering a damaged low-k film of a substrate and storage medium
摘要 There is provided a processing method for performing a recovery process on a damaged layer formed on a surface of a low-k film of a target substrate by introducing a processing gas containing a methyl group into a processing chamber. The method includes: increasing an internal pressure of the processing chamber up to a first pressure lower than a processing pressure for the recovery process by introducing a dilution gas into the processing chamber maintained in a depressurized state; then stopping the introduction of the dilution gas, and increasing the internal pressure of the processing chamber up to a second pressure as the processing pressure for the recovery process by introducing the processing gas into a region where the target substrate exists within the processing chamber; and performing the recovery process on the target substrate while the processing pressure is maintained.
申请公布号 US8048687(B2) 申请公布日期 2011.11.01
申请号 US20100791082 申请日期 2010.06.01
申请人 TOKYO ELECTRON LIMITED 发明人 SHIMIZU WATARU;KUBOTA KAZUHIRO;HAYASHI DAISUKE
分类号 H01L21/00 主分类号 H01L21/00
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