发明名称 |
Semiconductor memory device |
摘要 |
A semiconductor memory device includes: a first address buffer configured to be used in a test mode and a normal mode and to receive more addresses in the test mode than in the normal mode; and a second address buffer configured to be used in the normal mode and disabled in the test mode.
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申请公布号 |
US8050135(B2) |
申请公布日期 |
2011.11.01 |
申请号 |
US20100971723 |
申请日期 |
2010.12.17 |
申请人 |
HYNIX SEMICONDUCTOR, INC. |
发明人 |
SHIN BEOM-JU |
分类号 |
G11C8/00 |
主分类号 |
G11C8/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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