发明名称 Method and apparatus for predicting steady state temperature of solid state devices
摘要 The disclosure generally relates to method and apparatus for predicting the steady state temperature of solid state devices, preferably under transient conditions. An apparatus according to one embodiment of the disclosure includes a thermocouple for detecting temperature of the solid state system; a processor in communication with the thermocouple and programmed with instructions to: construct an initial curve for the solid state system, the initial curve having a shape; obtain a plurality of theoretical temperature curves for the solid state system; select one of the plurality of theoretical temperature curves having a shape closest to the shape of the initial curve; and superimposing the selected theoretical temperature curve on the initial curve to predict the steady state temperature.
申请公布号 US8047712(B1) 申请公布日期 2011.11.01
申请号 US20070881306 申请日期 2007.07.26
申请人 LOCKHEED MARTIN CORPORATION 发明人 STURNER WILLIAM P.;SHIH MING T.
分类号 G01K1/12;G01K3/04;G01K3/14 主分类号 G01K1/12
代理机构 代理人
主权项
地址