发明名称 Method for the adjustment of a device under test
摘要 A method for adjusting an output signal produced by a device under test from an input variable by: a) positioning the device under test at a first test device with a physical disturbance variable and a known input variable value, b) acquiring at least one measured value for the output signal, c) changing the adjustment state, d) acquiring a further measured value for the output signal, e) positioning the device under test at a further test device having a further disturbance variable value and the input variable value, f) acquiring a further measured value for the output signal, g) changing the adjustment state, h) acquiring a further measured value for the output signal, i) comparing the measured values acquired at the test devices for each adjustment state and determining a first adjustment state in which the correlation between the measured values is larger than in a second adjustment state.
申请公布号 US8049513(B2) 申请公布日期 2011.11.01
申请号 US20090436426 申请日期 2009.05.06
申请人 MICRONAS GMBH 发明人 LOTT ACHIM
分类号 G01R31/02 主分类号 G01R31/02
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