发明名称 Method of forming a MEMS topped integrated circuit with a stress relief layer
摘要 The bow in a wafer that results from fabricating a large number of MEMS devices on the top surface of the passivation layer of the wafer so that a MEMS device is formed over each die region is reduced by forming a stress relief layer between the passivation layer and the MEMS devices.
申请公布号 US8048704(B2) 申请公布日期 2011.11.01
申请号 US20100750145 申请日期 2010.03.30
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 SMEYS PETER;JOHNSON PETER
分类号 H01L33/12;H01L21/268;H01L29/82 主分类号 H01L33/12
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