发明名称 Device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect
摘要 The invention relates to measurement technique, namely to experimental studies of heat transport in thermoelectric materials intended for operation at elevated temperatures.The device for measuring the thermal conduction of thermoelectric materials depending on temperature using the Peltier effect includes a vacuum chamber (10), located inside a resistive heater (11) with the possibility of its movement along the vacuum chamber (10), in which is placed a stainless steel frame (9), in which are fixed two stainless steel tubes (7), in which are located quartz tubes (6), to which are attached two quartz wires (5), on which are installed stainless steel electrodes (2) in the form of sleeve. Inside the electrodes (2) are fixed probes, current-carrying wires, thermocouples, covered with silver (4), between the electrodes (2) being fixed a measurement specimen (1) with tinned edges. Between the stainless steel frame (9) and stainless steel tubes (7) are placed ceramic tubes (8) for the current-carrying wires.The result is achieved due to the fact that are reduced the unauthorized leakages of thermal energy, which is strictly necessary for maintenance of adiabatic conditions in the process of carrying out measurements at high temperatures.
申请公布号 MD430(Y) 申请公布日期 2011.10.31
申请号 MDS20110037 申请日期 2011.02.24
申请人 INSTITUTUL DE INGINERIE ELECTRONICA SI NANOTEHNOLOGII "D.GHITU" AL ASM;INSTITUTUL DE INGINERIE ELECTRONIC⍼ ⍼I NANOTEHNOLOGII "D.GHI⍼U" AL A⍼M 发明人 POPOVICI NICOLAE
分类号 G01N25/18;H01L35/00;H01L35/28;H01L35/32 主分类号 G01N25/18
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