发明名称 TANTALUM SPUTTERING TARGET
摘要 <p>TANTALUM SPUTTERING TARGETProvided is a tantalum sputtering target containing 1 mass ppm or more and 100 mass ppm or less of tungsten as an essential component, and having a purity of 99.998% or more excluding tungsten and gas components. Additionally provided is a tantalum sputtering target according to according to the above further containing 0 to 100 mass ppm of molybdenum and/or niobium, excluding 0 mass ppm thereof, wherein the total content of tungsten, molybdenum, and niobium is 1 mass ppm or more and 150 mass ppm or less, and wherein the purity is 99.998% ormore excluding tungsten, molybdenum, niobium and gas components. Thereby obtained is a high purity tantalum sputtering target comprising a uniform and fine structure and which enables stable plasma and yields superior film evenness (uniformity).</p>
申请公布号 SG174153(A1) 申请公布日期 2011.10.28
申请号 SG20110061181 申请日期 2010.08.04
申请人 JX NIPPON MINING & METALS CORPORATION 发明人 FUKUSHIMA ATSUSHI;ODA KUNIHIRO;SENDA SHINICHIRO
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