发明名称 SAMPLE HOLDER AND SAMPLE OBSERVATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a sample holder capable of continuously observing a sample even if the sample is heated and reducing a temperature difference between the sample and a heater, in a transmission electron microscope, and a sample observation method.SOLUTION: The sample holder has a heating section for fixing a sample film where the sample is mounted. The sample observation method includes steps of: fixing the sample film for mounting the sample on the heating section where the sample is heated; installing the heating section where the sample film is fixed on the sample holder; installing the sample on the sample film; and heating the heating section.
申请公布号 JP2011216426(A) 申请公布日期 2011.10.27
申请号 JP20100085657 申请日期 2010.04.02
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 NAKANO YASUTAKA;SATO TAKASHI;MATSUMOTO HIROAKI;NAGAKUBO KOHEI
分类号 H01J37/20;G01N1/28 主分类号 H01J37/20
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