发明名称 |
GLASS SUBSTRATE FOR FORMING SEMICONDUCTOR DEVICE VIA |
摘要 |
<p>Provided is a glass substrate for forming a semiconductor device via in which the incidence of alpha rays is significantly restricted, and which can be processed by laser and has a high affinity for silicon members. The glass substrate for forming a semiconductor device via: has a plurality of through holes; has an alpha count that is not more than 0.05 counts/cm2/hour; contains at least 40 wt% SiO2; and the total content of Li2O(wt%), Na2O (wt%) and K2O (wt%) is not more than 6.0 wt%; and has an average coefficient of thermal expansion that is within the range of 20 × 10-7/K to 40 × 10-7/K at 50°C to 350°C.</p> |
申请公布号 |
WO2011132603(A1) |
申请公布日期 |
2011.10.27 |
申请号 |
WO2011JP59320 |
申请日期 |
2011.04.14 |
申请人 |
ASAHI GLASS COMPANY, LIMITED.;KOIKE AKIO;ONO MOTOSHI;MURAKAMI RYOTA;KIKUGAWA SHINYA |
发明人 |
KOIKE AKIO;ONO MOTOSHI;MURAKAMI RYOTA;KIKUGAWA SHINYA |
分类号 |
H01L23/32;H01L23/15 |
主分类号 |
H01L23/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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