发明名称 |
CHAMBER APPARATUS AND EXTREME ULTRAVIOLET LIGHT GENERATION SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To enhance flexibility in the arrangement of various elements with respect to a plasma generation site.SOLUTION: A chamber apparatus is used with an external apparatus having an obscuration region. The chamber apparatus may include: a chamber 10 in which EUV light is generated; a collector mirror 14 provided in the chamber 10 for collecting the extreme ultraviolet light; a support for securing the collector mirror 14 to the chamber 10; and an output port W14 provided to the chamber for allowing the extreme ultraviolet light L2 collected by the collector mirror 10 to be introduced therethrough into the external apparatus. |
申请公布号 |
JP2011216851(A) |
申请公布日期 |
2011.10.27 |
申请号 |
JP20100288902 |
申请日期 |
2010.12.24 |
申请人 |
KOMATSU LTD;GIGAPHOTON INC |
发明人 |
NISHISAKA TOSHIHIRO;WATANABE YUKIO;ABE TAMOTSU;WAKABAYASHI OSAMU |
分类号 |
H01L21/027;H05G2/00 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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