发明名称 |
BUILT-IN SELF-TEST CIRCUIT FOR LIQUID CRYSTAL DISPLAY SOURCE DRIVER |
摘要 |
A built-in self-test (BIST) circuit for a liquid crystal display (LCD) source driver includes at least one digital-to-analog converter (DAC) and at least one buffer coupled to the respective DAC, wherein the buffer is reconfigurable as a comparator. A first input signal and a second input signal are coupled to the comparator. The first input signal is a predetermined reference voltage level. The second input signal is a test offset voltage in a test range.
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申请公布号 |
US2011260746(A1) |
申请公布日期 |
2011.10.27 |
申请号 |
US20100764346 |
申请日期 |
2010.04.21 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. |
发明人 |
HUANG JUI-CHENG;PENG YUNG-CHOW;SHEEN RUEY-BIN |
分类号 |
G01R31/02;G01R31/26 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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