发明名称 BUILT-IN SELF-TEST CIRCUIT FOR LIQUID CRYSTAL DISPLAY SOURCE DRIVER
摘要 A built-in self-test (BIST) circuit for a liquid crystal display (LCD) source driver includes at least one digital-to-analog converter (DAC) and at least one buffer coupled to the respective DAC, wherein the buffer is reconfigurable as a comparator. A first input signal and a second input signal are coupled to the comparator. The first input signal is a predetermined reference voltage level. The second input signal is a test offset voltage in a test range.
申请公布号 US2011260746(A1) 申请公布日期 2011.10.27
申请号 US20100764346 申请日期 2010.04.21
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HUANG JUI-CHENG;PENG YUNG-CHOW;SHEEN RUEY-BIN
分类号 G01R31/02;G01R31/26 主分类号 G01R31/02
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