| 摘要 |
PROBLEM TO BE SOLVED: To provide a resistive probing tip apparatus usable in a logic analyzer probing apparatus.SOLUTION: The resistive probing tip apparatus has one or more carriers 10 and one or more electrical contact assemblies 20. Each carrier has opposing surfaces 12, 14 with a plurality of resistors 18 engaging the carrier. Each of the plurality of resistors has opposing electrical contacts that are exposed at respective opposing surfaces of the carrier. Each electrical contact assembly has opposing surfaces with electrical contacts exposed at the opposing surfaces with each electrical contact exposed on one surface coupled to a corresponding electrical contact on the other opposing surface. The carrier and/or the electrical contact assembly may be selectively secured to either of a circuit board or a probe head. |
