发明名称 INSPECTION APPARATUS AND DEFECT DETECTION METHOD USING THE SAME
摘要 An inspection apparatus includes a feature detection section for detecting a first feature portion of an object to be inspected from an image based on a first condition, a defect detection section for detecting a first defect portion of the object based on the first feature portion, and a display section for displaying information indicative of the first defect portion together with the image.
申请公布号 US2011261189(A1) 申请公布日期 2011.10.27
申请号 US201113091235 申请日期 2011.04.21
申请人 OLYMPUS CORPORATION 发明人 HORI FUMIO
分类号 H04N7/18 主分类号 H04N7/18
代理机构 代理人
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