发明名称 ASPHERIC SURFACE MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a measuring apparatus constituted of a structure preventing a breakdown of an application end of an interference optical system due to a collision between a sample stage for holding a sample and an application end of the optical system when measuring an aspheric surface of a measured surface with high accuracy.SOLUTION: A sample holder mechanism A and an interference optical mechanism B are installed so as to allow relative movement severally, with the holder mechanism A for holding the sample 10 while the optical mechanism B composed of the interference optical system 2 for performing optical interference measurement by emitting measurement light. A breakdown of the optical system 2 is prevented by providing a low-strength part 64 on the sample stage 6 for holding the measured object 10 on its end in the holder mechanism A, the strength part 64 absorbing a shock in colliding with the application end 2a of the optical system 2.
申请公布号 JP2011215017(A) 申请公布日期 2011.10.27
申请号 JP20100083870 申请日期 2010.03.31
申请人 FUJIFILM CORP 发明人 TOMIMIZU MASAAKI;KATSURA SOUTO
分类号 G01B11/24;G01M11/00 主分类号 G01B11/24
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