METHOD FOR X-RAY SPECTRUM DETERMINATION OF EFFECTIVE ATOMIC NUMBER OF MATERIAL AND APPARATUS FOR DETERMINING EFFICIENT ATOMIC NUMBER OF MATERIAL

摘要

FIELD: chemistry. ^ SUBSTANCE: analysed material is exposed to characteristic or white X-rays and the secondary spectrum of scattered radiation is detected while measuring intensity of the base peak and the escape peak of amplitude distribution, and the effective atomic number of the analysed material is determined from the ratio of the measured intensities and a standard calibration curve obtained using material with known composition. ^ EFFECT: simple and highly accurate determination of the effective atomic number of material. ^ 3 cl, 4 dwg