发明名称 EMISSION SPECTROPHOTOMETER
摘要 PROBLEM TO BE SOLVED: To provide an emission spectrophotometer for easily performing analysis at appropriate analysis accuracy and analysis sensitivity according to the type, state, and analysis purpose of a sample.SOLUTION: The emission spectrophotometer excites the solid sample S to emit light by discharge, wavelength-disperses the emission light with a spectrometer 20, and detects light of a specific wavelength. The emission spectrophotometer includes a sample holding means for holding the solid sample S, a condenser lens 14 that is arranged between the sample holding means and the spectrometer 20, condenses a part of the emission light, and introduces it to the spectrometer 20, a light shielding mask 15 arranged ahead of the condenser lens 14, and a mask driving means 16 for altering the angle formed by a surface to be analyzed of the solid sample S and the optical axis of the emission light entering the spectrometer 20 by moving the light shielding mask 15.
申请公布号 JP2011215117(A) 申请公布日期 2011.10.27
申请号 JP20100086227 申请日期 2010.04.02
申请人 SHIMADZU CORP 发明人 OMORI YOSHIHISA
分类号 G01N21/67 主分类号 G01N21/67
代理机构 代理人
主权项
地址