发明名称 Self-Repairing Memristor and Method
摘要 A self-repairing memristor (300) and methods of operating a memristor (10), (310) and repairing a memristor (10), (310) employ thermal annealing (110). The thermal annealing (110) removes a short circuit in an oxide layer (12), (312) of the memristor (10), (310). Thermal annealing (110) includes heating the memristor (10), (310) to a predetermined annealing temperature for a predetermined annealing time period. The memristor (10), (310) returns to an electrically open circuit condition after the short circuit is removed.
申请公布号 US2011261608(A1) 申请公布日期 2011.10.27
申请号 US200913130822 申请日期 2009.01.29
申请人 BORGHETTI JULIEN;BRATKOVSKI ALEXANDRE M;PICKETT MATTHEW D 发明人 BORGHETTI JULIEN;BRATKOVSKI ALEXANDRE M.;PICKETT MATTHEW D.
分类号 G11C11/00;H01L21/02;H01L45/00 主分类号 G11C11/00
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