发明名称 SOURCE AND DRAIN REGIONS, CONTACT HOLES AND FABRICATION METHODS THEREOF
摘要 <p>A source/drain region includes a first region of which at least part of thickness is in the substrate, and a second region being on the first region and having different material from the first region. A method of fabricating the source/drain region includes forming recesses in the substrate beside two sides of the gate stack, forming a first semiconductor layer with at least part of which the recesses are filled, and forming a second semiconductor layer on the first semiconductor layer, with the material of the second semiconductor layer different from that of the first semiconductor layer. A contact hole and a fabrication method thereof are also disclosed, which can increase the contact area between the contact hole and the contact region, and can reduce the contact resistance.</p>
申请公布号 WO2011131053(A1) 申请公布日期 2011.10.27
申请号 WO2011CN71086 申请日期 2011.02.18
申请人 INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG 发明人 YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG
分类号 H01L21/768;H01L21/336 主分类号 H01L21/768
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