发明名称 |
SOURCE AND DRAIN REGIONS, CONTACT HOLES AND FABRICATION METHODS THEREOF |
摘要 |
<p>A source/drain region includes a first region of which at least part of thickness is in the substrate, and a second region being on the first region and having different material from the first region. A method of fabricating the source/drain region includes forming recesses in the substrate beside two sides of the gate stack, forming a first semiconductor layer with at least part of which the recesses are filled, and forming a second semiconductor layer on the first semiconductor layer, with the material of the second semiconductor layer different from that of the first semiconductor layer. A contact hole and a fabrication method thereof are also disclosed, which can increase the contact area between the contact hole and the contact region, and can reduce the contact resistance.</p> |
申请公布号 |
WO2011131053(A1) |
申请公布日期 |
2011.10.27 |
申请号 |
WO2011CN71086 |
申请日期 |
2011.02.18 |
申请人 |
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OFSCIENCES;YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG |
发明人 |
YIN, HAIZHOU;ZHU, HUILONG;LUO, ZHIJIONG |
分类号 |
H01L21/768;H01L21/336 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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