发明名称 |
Method for decontaminating semi-conductor wafers |
摘要 |
<p>The method involves lowering and increasing pressure in an enclosure (1). Gas i.e. nitrogen, heated at temperature higher than ambient temperature is injected into the enclosure during increasing the pressure in the enclosure, where the temperature ranges between 40 and 90 degree Celsius. The pressure lowering and increasing process is repeated for 3 to 15 times, where the pressure in the enclosure is lowered up to a low value.</p> |
申请公布号 |
EP2381466(A2) |
申请公布日期 |
2011.10.26 |
申请号 |
EP20110160035 |
申请日期 |
2011.03.28 |
申请人 |
STMICROELECTRONICS (ROUSSET) SAS |
发明人 |
MARTIN, CHRISTOPHE;COLLURA, SEBASTIEN |
分类号 |
H01L21/02;B08B5/00;C23C16/44 |
主分类号 |
H01L21/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|