发明名称 Semiconductor memory device capable of preventing damage to a bitline during a data masking operation
摘要 A semiconductor memory device includes a memory cell array having a plurality of memory cells coupled between a plurality of word lines and a plurality of bit line pairs, a bit line selection circuit configured to transmit data between a selected bit line pair and a local input/output line pair in response to a column selection signal, a local global input/output gate circuit configured to transmit data between the local input/output line pair and a global input/output line pair in response to a local global input/output selection signal, and a controller configured to drive the word lines, output the column selection signal having a first voltage level to the bit line selection circuit, and output the local global input/output selection signal having a second voltage level that is lower than the first voltage level to the local global input/output gate circuit, in response to an external address signal and an external command.
申请公布号 US8045404(B2) 申请公布日期 2011.10.25
申请号 US20100660439 申请日期 2010.02.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE BYUNG-HYUN;MOON BYUNG-SIK;KO SEUNG-BUM
分类号 G11C7/10 主分类号 G11C7/10
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