发明名称 Resistor and design structure having resistor material length with sub-lithographic width
摘要 A resistor and design structure including at least one resistor material length in a dielectric, each of the least one resistor material length having a sub-lithographic width are disclosed.
申请公布号 US8044764(B2) 申请公布日期 2011.10.25
申请号 US20080046647 申请日期 2008.03.12
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 HAKEY MARK C.;LUCE STEPHEN E.;NAKOS JAMES S.
分类号 H01C1/012 主分类号 H01C1/012
代理机构 代理人
主权项
地址