| 摘要 |
A method and apparatus allows controlling a plurality of test operations in an electronic device, and in particular a volatile or non-volatile memory device in which a test mode has already been established, without the need for additional device connections. One such operation may be switching device operation from test mode to functional mode, the normal operating mode of the device. Other test operations include support of continuity testing by external circuitry, support of externally accessing device identification with which the device has been previously programmed, support of built in self-test, support of self-repair and support of other operations determined as needs arise.
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