发明名称 Plasma oxidizing method, storage medium, and plasma processing apparatus
摘要 A plasma oxidizing method in which a plasma is produced in a processing chamber of a plasma processing apparatus under a processing condition that the proportion of oxygen in the processing gas is 20% or more and the processing pressure is 400 to 1333 Pa, and silicon exposed from the surface of an object to be processed is oxidized by the plasma to form a silicon oxide film.
申请公布号 US8043979(B2) 申请公布日期 2011.10.25
申请号 US20070443493 申请日期 2007.09.27
申请人 TOKYO ELECTRON LIMITED 发明人 KOBAYASHI TAKASHI;KITAGAWA JUNICHI;KABE YOSHIRO;SHIOZAWA TOSHIHIKO
分类号 H01L21/31;H01L21/469 主分类号 H01L21/31
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