发明名称 Plasma processing apparatus
摘要 A plasma processing apparatus includes a processing chamber; a plasma generating unit for generating a plasma of a gas supplied into the processing chamber; a substrate mounting table, disposed in the processing chamber, for mounting a semiconductor substrate having a surface on which an etching and/or a film forming process is to be performed. The apparatus further includes a metal member disposed in the processing chamber and to be etched by the plasma generated in the processing chamber to release a precursor of a film to be formed by the film forming process into the processing chamber; a gas supply unit for supplying a first and a second gas into the processing chamber, wherein the second gas which includes halogen atoms and is different from the first gas; a first and a second wiring for supplying high frequency power to the metal member and the substrate mounting table, respectively.
申请公布号 US8043471(B2) 申请公布日期 2011.10.25
申请号 US20070694027 申请日期 2007.03.30
申请人 TOKYO ELECTRON LIMITED 发明人 IIZUKA HACHISHIRO
分类号 C23C16/00;H01L21/306 主分类号 C23C16/00
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