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发明名称
APPARATUS FOR DETECTING THICKNESS OF THE CONDUCTOR USING DIFFERENTIAL PULSED EDDY CURRENT PROBE
摘要
申请公布号
KR20110115749(A)
申请公布日期
2011.10.24
申请号
KR20100035252
申请日期
2010.04.16
申请人
KOREA ATOMIC ENERGY RESEARCH INSTITUTE;KOREA HYDRO & NUCLEAR POWER CO., LTD.
发明人
PARK, DEUK GUN;CHEONG, YONG MOO;KIM, WHUNG WHOE
分类号
G01N27/90;G01B7/06
主分类号
G01N27/90
代理机构
代理人
主权项
地址
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