发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device which simplifies a peeling process and uniformly performing a peeling and transfer on a large-sized substrate.SOLUTION: After a metal film is formed on a first substrate and an insulating film containing silicon is formed in contact with the metal film, a metal oxide film has been formed on a surface of the metal film. A semiconductor element such as a thin film transistor is formed on the insulating film. A second substrate is fixed on the semiconductor element using a first adhesive, the first substrate is separated, a third substrate such as a film substrate is fixed under the semiconductor element using a second adhesive, and the second substrate is separated. At this time, by emitting an ultraviolet ray, a reduction in adhesion of or a peeling of the first adhesive and a curing of the second adhesive are performed simultaneously.
申请公布号 JP2011211208(A) 申请公布日期 2011.10.20
申请号 JP20110101055 申请日期 2011.04.28
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;TAKAYAMA TORU;MARUYAMA JUNYA;GOTO YUGO;FUKUMOTO YUMIKO
分类号 H01L27/12;G02F1/136;G02F1/1368;G06K19/07;G09F9/00;G09F9/30;H01L21/02;H01L21/336;H01L21/77;H01L21/84;H01L27/32;H01L29/786;H01L51/50;H05B33/02;H05B33/08;H05B33/10;H05B33/14 主分类号 H01L27/12
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