发明名称 NONVOLATILE SEMICONDUCTOR MEMORY DEVICE, AND METHOD OF FABRICATING THE SAME
摘要 PROBLEM TO BE SOLVED: To achieve an improved shape of a contact electrode and a reduced contact resistance.SOLUTION: The nonvolatile semiconductor memory includes: a memory cell having a floating gate electrode 12 formed via a first gate insulating film 11 above the semiconductor substrate 10 and a control gate electrode 14 formed via an inter-gate insulating film 13 formed on the floating gate electrode 12; and a contact electrode including a bottom electrode 32 brought into contact with the top face of the semiconductor substrate 10, a top electrode 34 formed via the inter-gate insulating film 33 formed at both ends of the bottom electrode 32, and a plug electrode 35 formed between the top electrodes 34 and brought into contact with the top face of the bottom electrode 32.
申请公布号 JP2011211112(A) 申请公布日期 2011.10.20
申请号 JP20100079828 申请日期 2010.03.30
申请人 TOSHIBA CORP 发明人 SUGIMAE KIKUKO;TOBA TAKAYUKI
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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