发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICE, AND METHOD OF FABRICATING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To achieve an improved shape of a contact electrode and a reduced contact resistance.SOLUTION: The nonvolatile semiconductor memory includes: a memory cell having a floating gate electrode 12 formed via a first gate insulating film 11 above the semiconductor substrate 10 and a control gate electrode 14 formed via an inter-gate insulating film 13 formed on the floating gate electrode 12; and a contact electrode including a bottom electrode 32 brought into contact with the top face of the semiconductor substrate 10, a top electrode 34 formed via the inter-gate insulating film 33 formed at both ends of the bottom electrode 32, and a plug electrode 35 formed between the top electrodes 34 and brought into contact with the top face of the bottom electrode 32. |
申请公布号 |
JP2011211112(A) |
申请公布日期 |
2011.10.20 |
申请号 |
JP20100079828 |
申请日期 |
2010.03.30 |
申请人 |
TOSHIBA CORP |
发明人 |
SUGIMAE KIKUKO;TOBA TAKAYUKI |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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