发明名称 METHOD FOR MEASURING FLAW IN OBJECT SURFACE
摘要 PROBLEM TO BE SOLVED: To provide a method for measuring a flaw in an object surface, measuring a flaw in an object surface with high accuracy, even when the flaw is measured over a length exceeding the range of a single measurement, in such a case that an obstacle exists on the surface, when a wear, deflection, etc., exist on the object surface.SOLUTION: A member 2 is provided between both ends of the object 3, and is deformed by pressing a horizontal plate 6 against it and cured; the horizontal plate is removed, and a reference line connecting the both ends of the object and the member surface is set; a measuring instrument is installed; the distance to the object surface is measured while moving the measuring instrument along the reference line, to acquire first measurement data representing flaw distribution; the measuring instrument is installed in the next measurement range; the distance to the object surface is measured while moving the measuring instrument, to acquire second measurement data; and data composed of the first measurement data and the second measurement data is acquired.
申请公布号 JP2011209006(A) 申请公布日期 2011.10.20
申请号 JP20100075081 申请日期 2010.03.29
申请人 TOSHIBA CORP 发明人 KUMAGAI KOICHI;MURAKAMI MASAKI;OHASHI TOSHIYUKI;TAKEDA HIROYA;CHIBA YOSHIYUKI;SATO YUTAKA
分类号 G01B11/30 主分类号 G01B11/30
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