发明名称 SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD
摘要 A semiconductor device includes a gate insulation film formed over a semiconductor substrate; a cap film formed over the gate insulation film; a silicon oxide film formed over the cap film; a metal gate electrode formed over the silicon oxide film; and source/drain diffused layers formed in the semiconductor substrate on both sides of the metal gate electrode.
申请公布号 US2011254106(A1) 申请公布日期 2011.10.20
申请号 US201113052776 申请日期 2011.03.21
申请人 FUJITSU SEMICONDUCTOR LIMITED 发明人 KATAKAMI AKIRA;AOYAMA TAKAYUKI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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