| 摘要 |
PROBLEM TO BE SOLVED: To provide a material structure observation device which does not need to remove a replica from a diagnostic target part, and which can observe a metal structure easily and quickly in the field.SOLUTION: The material structure observation device has a center line specifying means which specifies the central point which is the first position inside the boundary lines defining a grain boundary on image data, a closed curve setting means which sets a closed curve including the central point near the boundary lines, a closed curve deformation means which deforms the closed curve based on shading information on the image data near the closed curve, a grain boundary determination means which has the closed curve as the grain boundary when the deformed closed curve overlaps with all the boundary lines defining the grain boundary on the image data, the first arithmetic processing means which obtains the deformation degree of a crystal grain from the grain boundary determined by the grain boundary determination means, and the second arithmetic processing means which obtains the degree of creep damage from the deformation degree of the crystal grain obtained by the first arithmetic processing means based on the calibration curve of the degree of creep damage to the deformation degree of the identical material, which is stored beforehand in a storage means. |
