发明名称 APPARATUS FOR EVALUATION OF TEST DATA, AND PROGRAM EVALUATION SUPPORT METHOD
摘要 PROBLEM TO BE SOLVED: To extract data effective in a dynamic test of a program from waveform data such as time series data to generate test data.SOLUTION: A test data generation device includes: a data input device for input of an output expectation and an input value to the verifying program, attaching a data position indicating input order to a combination between the input value and an output value, and storing them; a graph display device graph-displaying changes of the input value and the output expectation; a cursor display device for displaying a cursor indicating relation between the input value and the output expectation corresponding to the input value on each graph; an extraction data designation device attaching extraction marks to data positions of the input value indicated by the cursor and the output value corresponding to the input value; and a test data output device for extracting the data positions attached with the extraction marks, and the input value and the output value of the data positions to generate the test data of the verifying program.
申请公布号 JP2011209970(A) 申请公布日期 2011.10.20
申请号 JP20100076410 申请日期 2010.03.29
申请人 FUJI ELECTRIC CO LTD 发明人 TOKUDA HIROKAZU
分类号 G06F11/28 主分类号 G06F11/28
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