发明名称 METHOD FOR CONTROLLING TESTING APPARATUS
摘要 A method for controlling testing apparatus having a plurality of device stations for test, a plurality of measuring portions measuring an identical item, and a matrix switch changing a coupling combination between the plurality of the device stations for test and the plurality of the measuring portions, including: performing checking step of a measuring portion with respect to the plurality of the measuring portions, the checking step measuring the measuring portion by measuring a standard device; and performing checking step of a device station for test with respect to the plurality of the device stations for test, the checking step mounting a standard sample on the device station for test and checking the standard sample with use of the measuring portion coupled to the device station for test on which the standard sample is mounted.
申请公布号 US2011252860(A1) 申请公布日期 2011.10.20
申请号 US201113168726 申请日期 2011.06.24
申请人 SUMITOMO ELECTRIC DEVICE INNOVATIONS, INC. 发明人 ONO HARUYOSHI;BABA ISAO;SUGIYAMA MAKOTO
分类号 G01D18/00 主分类号 G01D18/00
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