发明名称 METHOD FOR FABRICATING BUMP STRUCTURE WITHOUT UBM UNDERCUT
摘要 A method for fabricating bump structure without UBM undercut uses an electroless Cu plating process to selectively form a Cu UBM layer on a Ti UBM layer within an opening of a photoresist layer. After stripping the photoresist layer, there is no need to perform a wet etching process on the Cu UBM layer, and thereby the UBM structure has a non-undercut profile.
申请公布号 US2011254151(A1) 申请公布日期 2011.10.20
申请号 US20100761863 申请日期 2010.04.16
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIN CHIH-WEI;CHENG MING-DA;LU WEN-HSIUNG;LIU CHUNG-SHI
分类号 H01L23/498;H01L21/3205 主分类号 H01L23/498
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