发明名称 FIELD EFFECT TRANSISTOR AND MANUFACTURING METHOD THEREOF
摘要 A field effect transistor includes a channel layer of group-III nitride-based compound semiconductor; an interface layer formed on the channel layer and of AlXInYGa1-X-YN, where 0≦̸X≦̸1, 0≦̸Y≦̸1, and X+Y≦̸1, which is different from material of the channel layer, an electron supplying layer of group-III nitride-based compound semiconductor formed on the interface layer, the electron supplying layer having a recess that reaches the interface layer; a source electrode and a drain electrode formed on the electron supplying layer on respective sides of the recess; an insulating film formed on an inner surface of the recess; and a gate electrode formed on the insulating film.
申请公布号 US2011254055(A1) 申请公布日期 2011.10.20
申请号 US201113072798 申请日期 2011.03.28
申请人 FURUKAWA ELECTRIC CO., LTD. 发明人 SATO YOSHIHIRO;NOMURA TAKEHIKO
分类号 H01L29/778;H01L21/336 主分类号 H01L29/778
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