发明名称 RAISED SOURCE/DRAIN STRUCTURE FOR ENHANCED STRAIN COUPLING FROM STRESS LINER
摘要 A transistor is provided that includes a buried oxide layer above a substrate. A silicon layer is above the buried oxide layer. A gate stack is on the silicon layer, the gate stack including a high-k oxide layer on the silicon layer and a metal gate on the high-k oxide layer. A nitride liner is adjacent to the gate stack. An oxide liner is adjacent to the nitride liner. A set of faceted raised source/drain regions having a part including a portion of the silicon layer. The set of faceted raised source/drain regions also include a first faceted side portion and a second faceted side portion.
申请公布号 US2011254090(A1) 申请公布日期 2011.10.20
申请号 US20100760250 申请日期 2010.04.14
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 CHENG KANGGUO;DORIS BRUCE;KHAKIFIROOZ ALI;KULKARNI PRANITA;SHAHIDI GHAVAM
分类号 H01L29/06;H01L21/762 主分类号 H01L29/06
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