发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MANUFACTURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device and a method of manufacturing the same capable of controlling a working shape with more high precision by reducing charge-up induced by positive ions and controlling ion energy distribution.SOLUTION: A plasma treatment apparatus 10 as a semiconductor manufacturing apparatus comprises a chamber 11, a wafer-arranging electrode 12 which is formed in the chamber 11 and on which a semiconductor wafer W is disposed, a counter electrode 13 arranged in the chamber 11 so as to face the wafer-arranging electrode 12, a high-frequency power supply 14 for applying a high-frequency voltage to the wafer-arranging electrode 12, a first DC pulse power supply 17A for applying a negative first DC pulse voltage Vto the wafer-arranging electrode 12 to be superimposed on a high-frequency voltage, and a second DC pulse power supply 17B for applying a negative second DC pulse voltage Vto the counter electrode 13 in the off period of the first DC pulse voltage V.
申请公布号 JP2011211168(A) 申请公布日期 2011.10.20
申请号 JP20110020763 申请日期 2011.02.02
申请人 TOSHIBA CORP 发明人 HAYASHI HISATAKA;KAMINATSUI KEN;UI AKIO
分类号 H01L21/3065;C23C16/509;H01L21/265;H05H1/46 主分类号 H01L21/3065
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