发明名称 POLARIZATION COMPENSATED BEAM SPLITTER AND DIAGNOSTIC SYSTEM FOR HIGH POWER LASER SYSTEMS
摘要 A beam sampling system, includes a first beam splitter adapted to split a laser beam having a primary polarization component and a secondary polarization component, into a first intermediate sample beam, and a first beam splitter output beam, the intermediate sample beam including first percentage of the primary polarization component and a second percentage of the secondary polarization component. A 90-degree polarization rotator is positioned in the intermediate sample beam line. A second beam splitter is mounted so that the intermediate sample beam is split into an output sample beam on an output sample beam line, and a second transmitted beam, the output sample beam including substantially said first percentage of the secondary polarization component and substantially said second percentage of the primary polarization component.
申请公布号 US2011255088(A1) 申请公布日期 2011.10.20
申请号 US201113038555 申请日期 2011.03.02
申请人 METAL IMPROVEMENT COMPANY LLC 发明人 DANE C. BRENT;LAO EDWARD W.H.;FOCHS SCOTT N.
分类号 G01J4/00;G02B27/10;G02B27/28 主分类号 G01J4/00
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