发明名称 ANALYZING DEVICE, AND METHOD
摘要 PROBLEM TO BE SOLVED: To minimize the loss caused by the generation of the same failure in a plurality of analyzing devices when the same specimen is analyzed by the respective analyzing devices.SOLUTION: The analysis of a specimen of one analyzing device 1A, wherein it is determined that analysis is not started with respect to the same specimen by another analyzing device 1, of a plurality of the analyzers 1, is precedently started and another analyzing device 1B stands by for analysis. Analysis is stopped in a case that failure is produced during the analysis of one analyzing device 1A while the kind of the failure is sent to another analyzing device 1B and, when analysis is normally completed, an analysis starting order for releasing the standby state of an analyzing means 20 is sent to another analyzing device 1B. When the kind of failure is sent in another analyzing device 1B, the kind of failure and the serious degree of failure preset at each kind of failure are output to the outside in a standby state and, when the analysis starting order is sent, analysis is started.
申请公布号 JP2011209004(A) 申请公布日期 2011.10.20
申请号 JP20100075019 申请日期 2010.03.29
申请人 FUJIFILM CORP 发明人 ITO AKIRA;NICHIBE DAISUKE;SHIRAISHI JUNPEI
分类号 G01N35/00;G01N35/02;G01N37/00 主分类号 G01N35/00
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