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发明名称
MVP PROBE CARD BOARD MANUFACTURING METHOD FOR WAFER LEVEL TEST
摘要
申请公布号
KR20110115005(A)
申请公布日期
2011.10.20
申请号
KR20100034440
申请日期
2010.04.14
申请人
BRIDGE CO., LTD.
发明人
LEE, DONG WOOK
分类号
H01L21/66
主分类号
H01L21/66
代理机构
代理人
主权项
地址
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