发明名称 Semiconductor element
摘要 <p>In a Schottky diode 11, a gallium nitride support base 13 includes a first surface 13a and a second surface 13b opposite from the first surface and has a carrier concentration exceeding 1 x 1018 cm-3. A gallium nitride epitaxial layer 15 is disposed on the first surface 13a. An Ohmic electrode 17 is disposed on the second surface 13b. The Schottky electrode 19 is disposed on the gallium nitride epitaxial layer 15. A thickness D1 of the gallium nitride epitaxial layer 15 is at least 5 microns and no more than 1000 microns. Also, the carrier density of the gallium nitride epitaxial layer 15 is at least 1 x 1014 cm-3 and no more than 1 x 1017 cm-3. </p>
申请公布号 EP2367204(A3) 申请公布日期 2011.10.19
申请号 EP20110169624 申请日期 2005.08.25
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 KIYAMA, MAKOTO;OKAHISA, TAKUJI;SAKURADA, TAKASHI
分类号 H01L29/20;H01L21/20;H01L21/329;H01L21/336;H01L29/04;H01L29/12;H01L29/417;H01L29/423;H01L29/47;H01L29/78;H01L29/861;H01L29/868;H01L29/872 主分类号 H01L29/20
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