发明名称 Thin film resistor element and manufacturing method of the same
摘要 In order to provide a thin-film resistor and a manufacturing method thereof capable of restraining reduction of a Q-value of varactor by reducing a parasitic capacitance between the resistor and the substrate, the thin-film resistor includes a semiconductor substrate 10 including an integrated circuit 12 having a plurality of electrode pads 14 placed in a distance from each other in the most upper part of a plurality of stacked interconnections, and the integrated circuit 12 having a passivation film 16 formed between the plurality of electrode pads 14; a secondary interconnections 18 electrically connected to the electrode pads 14; an insulating film 20 formed in a place in between the secondary interconnections 18 on the passivation film 16; and a resistor 26 formed 18 in a predetermined place in between the secondary interconnections 18 on the insulating film 20.
申请公布号 US8040213(B2) 申请公布日期 2011.10.18
申请号 US20090382894 申请日期 2009.03.26
申请人 OKI SEMICONDUCTOR CO., LTD. 发明人 ASHIKAGA KINYA
分类号 H01C1/012 主分类号 H01C1/012
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