发明名称 Apparatus for polishing a wafer and method for detecting a polishing end point by the same
摘要 A wafer polishing apparatus includes a polishing tape extending between two guide rollers, a first surface of the polishing tape contacting a surface of a wafer to be polished, a polishing head including a pusher pad, the pusher pad adapted to push the polishing tape against the surface of the wafer to be polished, a color image sensor adjacent to the polishing tape, the color image sensor being adapted to detect a color image of the polishing tape and to output a signal corresponding to the detected color image, and a controller connected to the color image sensor, the controller being adapted to receive the signal output from the color image sensor and to determine when a color of the color image detected by the color image sensor changes, a change in the color image indicating a polishing end point.
申请公布号 US8038508(B2) 申请公布日期 2011.10.18
申请号 US20080285852 申请日期 2008.10.15
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LIM JONG-HEUN;SHIN SUNG-HO;YOON BO-UN;HONG CHANG-KI
分类号 B24B49/00 主分类号 B24B49/00
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