发明名称 Semiconductor device and method of dual-molding die formed on opposite sides of build-up interconnect structures
摘要 A semiconductor device has dual-molded semiconductor die mounted to opposite sides of a build-up interconnect structure. A first semiconductor die is mounted to a temporary carrier. A first encapsulant is deposited over the first semiconductor die and temporary carrier. The temporary carrier is removed. A first interconnect structure is formed over a first surface of the first encapsulant and first semiconductor die. The first interconnect structure is electrically connected to first contact pads of the first semiconductor die. A plurality of conductive pillars is formed over the first interconnect structure. A second semiconductor die is mounted between the conductive pillars to the first interconnect structure. A second encapsulant is deposited over the second semiconductor die. A second interconnect structure is formed over the second encapsulant. The second interconnect structure is electrically connected to the conductive pillars and first and second semiconductor die.
申请公布号 US8039304(B2) 申请公布日期 2011.10.18
申请号 US20090540174 申请日期 2009.08.12
申请人 STATS CHIPPAC, LTD. 发明人 PAGAILA REZA A.
分类号 H01L21/44;H01L21/48;H01L21/50 主分类号 H01L21/44
代理机构 代理人
主权项
地址