发明名称 Digital circuits with adaptive resistance to single event upset
摘要 A digital circuit with adaptive resistance to single event upset. A novel transient filter is placed within the feedback loop of each latch in the digital circuit to reject pulses having a width less than T, where T is the longest anticipated duration of transients. The transient filter includes a first logic element having a controllable inertial delay and a second logic element coupled to an output of the first logic element. A first controller provides a control voltage VcR to each first logic element to control a rise time of the first logic element to be equal to T. A second controller provides a control voltage VcF to each first logic element to control a fall time of the first logic element to be equal to T.
申请公布号 US8040157(B2) 申请公布日期 2011.10.18
申请号 US20100878950 申请日期 2010.09.09
申请人 RAYTHEON COMPANY 发明人 FARWELL WILLIAM D.
分类号 H03K9/08 主分类号 H03K9/08
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