发明名称 Field effect transistor having reduced contact resistance and method for fabricating the same
摘要 A field effect transistor includes a nitride semiconductor layered structure that is formed on a substrate and includes a capping layer made of a compound represented by a general formula of InxAlyGa1−yN (wherein 0<x≦̸1, 0≦̸y<1 and 0<x+y≦̸1). A non-alloy source electrode and a non-alloy drain electrode are formed on the capping layer so as to be spaced from each other.
申请公布号 US8039329(B2) 申请公布日期 2011.10.18
申请号 US20100723069 申请日期 2010.03.12
申请人 PANASONIC CORPORATION 发明人 NAKAZAWA SATOSHI;UEDA TETSUZO
分类号 H01L21/335 主分类号 H01L21/335
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