发明名称 |
Method and apparatus for identifying broken pins in a test socket |
摘要 |
A method includes scanning a test socket after removal of a device under test to generate scan data. The scan data is compared to reference data. A presence of at least a portion of a pin in the test socket is identified based on the comparison. A test system includes a test socket, a scanner, and a control unit. The test socket is operable to receive devices under test. The scanner is operable to scan a test socket after removal of a device under test to generate scan data. The control unit is operable to compare the scan data to reference data and identify a presence of at least a portion of a pin in the test socket based on the comparison.
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申请公布号 |
US8040140(B2) |
申请公布日期 |
2011.10.18 |
申请号 |
US20100946386 |
申请日期 |
2010.11.15 |
申请人 |
GLOBALFOUNDRIES, INC. |
发明人 |
RYSKOSKI MATTHEW S.;WOOTEN CHRISTOPHER L.;HAN SONG;KIMBROUGH DOUGLAS C. |
分类号 |
G01M99/00;G01R31/04;G01R31/00 |
主分类号 |
G01M99/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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