SCANNING WAVELENGTH SYSTEM AND METHOD CALIBRATING SUCH A SYSTEM

摘要

A scanning wavelength system measures properties of a device under test, during a scan wherein the wavelength of an optical probe signal are varied. During the scan the scanning wavelength system is characterized or calibrated by - supplying a first fraction of the optical probe signal to a device under test; - supplying a second fraction of the optical probe signal to a reference device; - supplying a third fraction of the optical probe signal to detector; - supplying light at a reference wavelength from a reference source to the detector together with the third fraction; - processing a detector signal by electronics and/or software to identify an event that a wavelength of the scanning source substantially equals the reference wavelength.